Isifanekiso | Ifomethi ye-Sen Sensor | Ubude obugxile (mm) | I-FOV (H * v * d) | I-TTL (MM) | Isihlungi se-IR | Umphetho | Insika | Intengo yokukodwa | ||
---|---|---|---|---|---|---|---|---|---|---|
Okuningi +NGAPHANSI- | Ch684a | 2/3 "" | 75 | 6.711º * 5.04ººº 8.38 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch683a | 2/3 "" | 50 | 10.44º * 8.4º * 12.3 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch682a | 2/3 "" | 35 | 13.1º * 9.9ºº 16.3 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch681a | 2/3 "" | 25 | 20.1º * 15.3º 24.6 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch680a | 2/3 "" | 16 | 30.8. * 23.1º * 38.5 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH679A | 2/3 "" | 12 | 39.8º * 30.4º 48.5 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch678a | 2/3 "" | 8 | 57.6º 44º * 67.6 ° | / | / | F2.8-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH641B | 2/3 "" | 8 | 57.6º 44.9º * 69.0 ° | / | / | F1.6-16 | C | $ 45Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH642B | 2/3 "" | 12 | 38.9º th * 29.6ºº | / | / | F1.4-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH643B | 2/3 "" | 16 | 29.9º9 * 22.7º | / | / | F1.6-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH644B | 2/3 "" | 25 | 20.34º * 15.78º | / | / | F1.4-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH645B | 2/3 "" | 35 | 13.14ºº * * 9.8º | / | / | F1.7-16 | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | CH646B | 2/3 "" | 50 | 10.1º * 7.5º | / | / | / | C | Cela isilinganiso | |
Okuningi +NGAPHANSI- | Ch677a | 2/3 "" | 6 | 73.3 ° * 57.5 ° | / | / | F1.4-16 | C | Cela isilinganiso | |
2/3 ""umshini wokubuka umshiniI-ES inguchungechunge lwelensi ephezulu yokulungiswa nge-C Mount. Zenzelwe inzwa efinyelela ku-2/3-intshi futhi zinikeze insimu yokubuka e-Angle ngokuhlanekezela okuphansi.
Lawa ma-lens wombono womshini angasetshenziselwa ukuhlola ama-semiconductor. Ngokuhambisana nezinye izingxenye zohlelo lokubona koMshini, basebenzisa ukukhanya okujulile kwe-Ultraviolet Wavelers ukuze bahlole ama-wafers kanye namaski ukufeza isivinini esikhulu nesixazululo esidingekayo.
IMetrology kanye nokuhlolwa kubalulekile ekuphathweni kwenqubo yokukhiqiza i-semiconductor. Kunezinyathelo ezingama-400 kuye kwezingu-600 enqubweni yokukhiqiza ephelele yama-semiconductor ama-wafers, azokwenziwa ngokuhamba kwezinyanga ezimbili kuya kwezimbili. Uma kukhona iziphambeko zenzeka ekuqaleni kwenqubo, konke ukucubungula okulandelayo akunangqondo.
Ukuthola iziphambeko nokucacisa izindawo zabo (Ukudidiyela isikhundla) yindima eyinhloko yemishini yokuhlola. Amalensi wombono womshini abamba izingxenye ezingalungile noma ezimbi ngaphambi kokuba zakhele emihlanganweni emikhulu. Ngokushesha lapho izinto ezingenaphutha zingatholakala futhi zisuswe kwinqubo yokukhiqiza, imfucuza encane kakhulu kwinqubo, ethuthukisa ngokuqondile isivuno. Uma kuqhathaniswa nezindlela zezandla zokuqapha kanye nokuhlola, izinhlelo zokuhlola umshini ezenzakalelayo ngekhwalithi ephezulu ye-lens ephakeme zishesha, zisebenza ngokungakhathali, futhi zikhiqize imiphumela engaguquki.