Umzekelo | Ubume boluvo | Ubude bokujongisisa(mm) | I-FOV (H*V*D) | TTL(mm) | Isihluzo se-IR | Umngxuma wokuvula | Ntaba | Ixabiso lento | ||
---|---|---|---|---|---|---|---|---|---|---|
OKUNGAKUMBI+NGAPHANTSI- | CH684A | 2/3" | 75 | 6.71º*5.03º | / | / | F2.8-22 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH683A | 2/3" | 50 | 10.5º*8.5º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH682A | 2/3" | 35 | 13.1º*9.9º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH681A | 2/3" | 25 | 20.1º*15.3º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH680A | 2/3" | 16 | 30.8º*23.1º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH679A | 2/3" | 12 | 39.8º*30.4º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH678A | 2/3" | 8 | 57.6º*44.1º | / | / | F2.8-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH641B | 2/3" | 8 | 57.6º*44.9º*69.0° | / | / | F1.6-16 | C | $45Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH642B | 2/3" | 12 | 38.9º*29.6º | / | / | F1.4-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH643B | 2/3" | 16 | 29.9º*22.7º | / | / | F1.6-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH644B | 2/3" | 25 | 20.34º*15.78º | / | / | F1.4-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH645B | 2/3" | 35 | 13.14º*9.8º | / | / | F1.7-16 | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH646B | 2/3" | 50 | 10.1º*7.5º | / | / | / | C | Cela iQuote | |
OKUNGAKUMBI+NGAPHANTSI- | CH677A | 2/3" | 6 | 73.3 ° * 57.5 ° | / | / | F1.4-16 | C | Cela iQuote | |
2/3″Ilensi yombono womatshinies luthotho lwelensi ekwisisombululo esiphezulu kunye neC Mount. Ziyilelwe ukuya kuthi ga kwi-2/3-intshi yoluvo kwaye zinikeze i-angle yokujonga intsimi ngokuphambuka okuphantsi.
EziIlensi yombono womatshinii-es ingasetyenziselwa ukuhlola i-semiconductors. Ngokudityaniswa namanye amacandelo enkqubo yokubona koomatshini, basebenzisa ukukhanya okunzulu kwe-ultraviolet wavelength ukuhlola iiwafers kunye nemaski ukufikelela kwisantya esiphezulu esifunekayo kunye nesisombululo.
I-Metrology kunye nokuhlolwa kubalulekile kulawulo lwenkqubo yokuvelisa i-semiconductor. Kukho amanyathelo angama-400 ukuya kuma-600 kwinkqubo yokwenziwa kwayo yonke i-semiconductor wafers, eyenziwa kwisithuba senyanga enye ukuya kwezimbini. Ukuba naziphi na iziphene zenzeka kwangethuba kwinkqubo, yonke inkqubo elandelayo ayinangqiqo.
Ukufumanisa iziphene kunye nokucacisa iindawo zabo (ulungelelwaniso lwezikhundla) yindima ephambili yezixhobo zokuhlola. Iilensi zokubona ngomatshini zibamba iindawo ezingachanekanga okanye ezimbi ngaphambi kokuba zakhiwe kwiindibano ezinkulu. Ngokukhawuleza ukuba izinto ezineziphene zingabonwa kwaye zisuswe kwinkqubo yokuvelisa, inkunkuma encinci kwinkqubo, ephucula ngokuthe ngqo isivuno. Xa kuthelekiswa neendlela zezandla zokubeka iliso kunye nokuhlola, iinkqubo zokujonga umatshini ozenzekelayo kunye ne-lens ephezulu ye-optical lens zikhawuleza, zisebenza ngokungakhathali, kwaye zivelisa iziphumo ezihambelanayo.